New-Tech Magazine | September 2016 | Digital edition

Participation in the conference is free of charge Tuesday 22.11.2016

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TEST & MEASUREMENT Avenue Convention and Event Center, Airport City

Tuesday , 08:30-14:30 | 22.11.16

THE ANNUAL CONFERENCE FOR TEST MEASUREMENTS Dr. Naor Wainer | Philips Medical Spectral CT - The new Standard of Care Dr. Eran Kaplan VP R&D and Technologies | Medinol R&D considerations in the design and manufacturing of Coronary Stressed Wounds – how can we accelerate healing In this talk I will explain how we can accelerate gap closure, using biomechanical approaches and natural remedies Mr. Netanel (Tani) Frankel | Intersystems The key challenges facing medical device manufacturers Dr David Guez | The Advanced Technology Center Sheba Medical Center Combination of advanced MRI techniques and machine learning algorithms for improved management of patients with brain tumors Mr. Francois Villeneuve EMEA Marketing for Sensors, Sensor Business Line | NXP Semiconductors The Role of Sensors in IoT Medical and Healthcare Applications Dr. Yaron Hefetz | Patent Attorney A new isotope imaging system for breast cancer early detection, biopsy guidance, and treatment Mr. Roi S. Melzer | EHRLICH & FENSTER How to build a winning IP portfolio Stents and Stent Delivery Systems Prof. Daphne Weihs | Technion

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EXHIBITORS

For details please contact: Shirley Mayzlish: shirley@new-techmagazine.com +972-52-7538989

For submitting a callout for lectures : Yael Ko er - Rokban : yael @ new - techmagazine . com +972-52-7953999

The conference and exhibition are for employees of High-Tech industry, electronics, and academic institutions only.

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*ההשתתפות בתערוכה ובכנס הם ללא תשלום, אך נדרשת הרשמה מוקדמת ואישור החברה המארגנת. www.new-techevents.com ניתן להירשם באתר החברה: Participation in the conference is free but advance registration is required you can register through the company s web site: www.new-techevents.com