New-Tech Military Magazine | Sep-Oct 2016 | Digital Edition

Participation in the conference is free of charge Tuesday 22.11.2016

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TEST & MEASUREMENT Avenue Convention and Event Center, Airport City

Tuesday , 08:30-14:30 | 22.11.16

THE ANNUAL CONFERENCE FOR TEST MEASUREMENTS Mr. Avi Bar Mashiach, Tektronics Mixed domain analysis, unique capabilities Mr. Eyal Seroussi, Simulation of Biological and Medical signals using AWG Mr. Oren Hagai, President & CTO, Interlligent Moving Up to Millimeter Waves Dr. Paul Brooks, Vaivi 400G Ethernet - new directions in test Mr. Rami Azulay, Orcanos e-DHR Derived Directly from ATE Test & Measurement Running Show , is the Israeli premier conference dedicated to the electronic test of devices , boards and systems - covering the complete cycle from design veri cation , test , diagnosis , failure analysis and back to process and design improvement - all processes and equipment . At The Test & Measurement Running Show , test and design professionals can confront the challenges the industry faces , and learn how these challenges are being addressed by the combined e orts of academia , design tool and equipment suppliers , design- ers , and test engineers

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EXHIBITORS

For details please contact: Shirley Mayzlish: shirley@new-techmagazine.com| +972-52-7538989

The conference and exhibition are for employees of High-Tech industry, electronics, and academic institutions only.

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*ההשתתפות בתערוכה ובכנס הם ללא תשלום, אך נדרשת הרשמה מוקדמת ואישור החברה המארגנת. www.new-techevents.com ניתן להירשם באתר החברה: Participation in the conference is free but advance registration is required you can register through the company s web site: www.new-techevents.com