New Tech Europe | Jan 2017 | Digital Edition

new products

Automotive companies today face increased testing challenges, exacerbated by the emergence of the connected car and semi- and fully-autonomous vehicles. Both OEMs and suppliers need flexible test systems that can quickly adapt to changing technologies and standards while also delivering a high-level starting point to speed up system implementation and deployment. At ATE, NI will showcase theAdvanced Driver Assistance Systems (ADAS) Radar Test Solution for performing RF measurements and target simulation for radar sensors; the HIL Simulator based on the new SLSC open architecture for switches, loads and signal conditioning; and the Direct Injector Control Module (DCM) for driving and controlling any type of injector. The ADAS Radar Test Solution combines NI’s recently released PXIe-5840 second-generation vector signal transceiver (VST) with banded, frequency-specific upconverters and downconverters designed to test the 76–81 GHz radar band with 1 GHz of real-time bandwidth. Engineers can program the VST’s FPGA with LabVIEW to use the ADAS Test Solution for radar target emulation, in the range from 1 m to 250 m with a resolution of 10 cm. NI’s HIL Simulators are built on open standards like PXI and SLSC, giving customers complete test coverage by taking advantage of a massive breadth of native I/O and signal conditioning that includes cameras and RF for testing automotive radar. The DCM is an integrated, turnkey test and measurement device. Built for injector research, validation and test, it gives customers the flexibility to control any engine and drive a large variety of injectors with complex control solutions and advanced injection profiles. NI has also extended its platform with an ecosystem of industry-leading partners in the connected car and advanced vehicle technology space. Showcased in the NI booth this year will be Averna for infotainment test, Bloomy for battery management system test, Danlaw for V2X communication, IPG for ADAS simulation and test and Signal.X for in-vehicle noise and vibration analysis. “From concept to production, NI smarter test solutions can help customers reduce cost across all stages of vehicle development and future proof their test systems against rapidly expanding test requirements,” said

three CAN ports including support for the latest CAN FD high-speed standard, a hardware accelerator for crypto algorithms including SHA-2, PK and AES, and One-Time- Programmable (OTP) memory for master-key storage and tamper prevention. The microcontroller draws very little current in standby mode, and complements careful power management throughout the chip to minimize drain on the vehicle’s electrical supply. Additional advances include increased thermal dissipation versus execution performance, which helps simplify thermal management for optimum reliability, as well as flexible signal routing that simplifies audio design. ST supports designers using the new chips with comprehensive software and middleware IP that streamlines the design of feature-rich displays and instruments. The Accordo 5 family comprising the STA1275, STA1285, and STA1295 is in sampling phase now. The STA1295 with dual-core Cortex-A7 processor is available in a 19mm x 19mm x 1.7mm LFBGA529 package. Please contact your local ST sales office for pricing options and further information.

NI Demonstrates Autonomous Vehicle Test Solutions NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced today new technology demonstrations of test solutions for the rapidly expanding autonomous vehicles market. These test solutions include all facets of vehicle design, verification and production, and will be on display at the Automotive Testing Expo (ATE) USA 2016 in Novi, Michigan, October 25–27.

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